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dc.contributor.authorUchegbulam, O-
dc.contributor.authorAyolabi, E. A-
dc.date.accessioned2022-07-21T09:51:10Z-
dc.date.available2022-07-21T09:51:10Z-
dc.date.issued2014-10-02-
dc.identifier.citationUchegbulam, O & Ayolabi, E. A (2014). Application of Electrical Resistivity Imaging in Investigating Groundwater Pollution in Sapele Area, Nigeria. Journal of Water Resource and Protection, 6, 1369-1379.en_US
dc.identifier.urihttp://localhost:8080/xmlui/handle/123456789/822-
dc.description.abstractSixty-four multi-electrode Lund imaging system coupled with ABEM SAS 4000 Terrameter was used for the electrical imaging of the study area. Wenner and Gradient arrays with 2 m minimum electrode spacing were employed which revealed resistivity changes in the vertical and horizontal directions along the survey lines. Earth imager software was employed for the processing and the iteration of the 2-D resistivity data. The subsurface is characterized with soil material with resistivity ranging from 42 - 15,000 Ohm-m, reflective of varying degree of conductivity associated with changing lithology and fluid type. Correlation with borehole data shows that the first 10 m is composed of laterite. While sand materials occupy 10 to about 60 m beneath the surface, with anomalously high resistivity ≤ 15,000 Ohm-m in most parts. These high resistivity formations can be attributed to the presence of hydrocarbon within the subsurface, which is an indication that shallow aquifer in the study area has been polluted. The water level in the study area is close to the surface, between 4 - 5 m. As a result of the high resistivity formations in most parts, deep wells of about 45 m are recommended after geophysical investigations.en_US
dc.language.isoenen_US
dc.publisherScientific Researchen_US
dc.relation.ispartofseries6;-
dc.subjectElectrical Resistivityen_US
dc.subjectImagingen_US
dc.subjectPollutionen_US
dc.subjectTraverse Linesen_US
dc.titleApplication of Electrical Resistivity Imaging in Investigating Groundwater Pollution in Sapele Area, Nigeriaen_US
dc.typeArticleen_US
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